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#Xsection 10.2 download
You can also sign up for email updates on the SEC open data program, including best practices that make it more efficient to download data, and SEC.gov enhancements that may impact scripted downloading processes. Please declare your traffic by updating your user agent to include company specific information.įor best practices on efficiently downloading information from SEC.gov, including the latest EDGAR filings, visit sec.gov/developer. Your request has been identified as part of a network of automated tools outside of the acceptable policy and will be managed until action is taken to declare your traffic. To allow for equitable access to all users, SEC reserves the right to limit requests originating from undeclared automated tools. This next-generation Silicon Drift Detector (SDD) EDS from JEOL collects X-rays from S/TEM samples at an unprecedented large solid angle of up to 2.21 steradians from a detection area of 158mm 2.Your Request Originates from an Undeclared Automated Tool Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Our new high sensitivity quadrant BSE detector can provide a Live 3D surface reconstruction enhancing your view of specimens with complex topography such as a fracture surface, plating defect, etc. All data is linked for instant view of analysis locations. Zeromag, with our integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. The JSM-IT510 includes a large analytical chamber and stage. Powerful – High resolution W filament source (LaB6 option) with unsurpassed low kV performance.
#Xsection 10.2 series
This SEM series is equipped with a large specimen chamber that accommodates a wide variety of detectors and accessories such as: EDS, WDS, EBSD, CL, STEM, heating/cooling substages etc. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. All this technology packed into a compact platform for unprecedented ease-of-use.įlexible – Choose a platform that is right for you. Our embedded Signal Depth display enhances understanding of analytical spatial resolution. Simple SEM simplifies workflow for the most routine tasks.
We’ve taken it to the next level with Simple SEM, built-in automation for image collection at multiple locations and conditions.
JEOL’s Intelligent Technology delivers seamless navigation from optical to SEM imaging, Live EDS both spectrum and X-ray maps and the best auto functions from alignment to focus for fast, clear, and sharp images. Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level.
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